1.9 Oбщепринятые сокращения в области ЭК

Табл. 1.12

Сокращение Расшифровка
ASIC Application Specific Integrated Circuit
AWG American Wire Gauge
BGA Ball Grid Array
BQFP Bumpered Quad Flat Pack
BV Breakdown Voltage
CAD Computer Aided Design
CBGA Ceramic Ball Grid Array
CM Contract Manufacturing or Contract Manufacturer
CMOS Complementary Metal Oxide Semiconductor
COB Chip-On-Board
COG Chip-On-Glass
COTS Commercial Off The Shelf
CPLD Complex Programmable Logic Device
CSP Chip Scale Package
CTE Coefficient of Thermal Expansion
DFM Design For Manufacturability
DFN Dual Flat No-lead
DIP Dual In-line Package
DRAM Dynamic Random Access Memory
DWV Dielectric Withstanding Voltage
ECC Error Correction Code
ECL Emitter-Coupled Logic
EDA Electronic Design Automation
EEPLD Electrically Erasable Programmable Logic Device
EMC Electromagnetic Compatibility
EMI Electromagnetic Interference
EMS Electronic Manufacturing Services
EOL End Of Life
EPLD Erasable Programmable Logic Device
ESD Electrostatic Discharge
ESR Equivalent Series Resistance
ESL Equivalent Series Inductance
FBGA Fine-pitch Ball Grid Array
FC Flip Chip
FCOB Flip Chip On Board
FCOC Flip Chip On Ceramic
FET Field Effect Transistor
FMEA Failure Mode Effect Analysis
FPGA Field Programmable Gate Array
FPT Fine Pitch Technology
FRACAS Failure Reporting, Analysis and Corrective Action System
GAL Generic Array Logic
HALT Highly Accelerated Life Test
HASS Highly Accelerated Stress Screening
HAST Highly Accelerated Stress Test
HBM Human Body Model
HSOP Small Outline Package with a Heat Sink
I/O Input/Output
IC Integrate Circuit
ICT In-Circuit Test
IGBT Integrated Gate Bipolar Transistor
IP Intellectual Property
IR Infrared
LCCC Leadless Ceramic Chip Carrier
LCD Liquid-Crystal Display
LIF Low Insertion Force
LPCC Leadless Plastic Chip Carrier
LSI Large Scale Integration
LTB Last Time Buy
LTS Last Time Shipment
LVT Low Voltage (BiCMOS) Technology
MELF Metal Electrode Leadless Face
MEMS MicroElectroMechanical Systems
MLC Multi-Level Cell
MLCC Multilayer Ceramic Capacitor
MOS Metal Oxide Semiconductor
MOSFET Metal Oxide Semiconductor Field Effect Transistor
MSD Moisture Sensitive Diode
MSL Moisture Sensitivity Level
MTBF Mean Time Between Failures
MTTF Mean Time to Failure
NEMI National Electronics Manufacturing Initiative
NEDA National Electronic Distributors Association
IDEA Independent Distributors of Electronic Association
NRE Non-Recurring Engineering
OEM Original Equipment Manufacturer
OLED Organic Light Emitting Diodes
PAL Programmable Array Logic
PBGA Plastic Ball Grid Array
PCA Printed Circuit Assembly
PCB Printed Circuit Board
PCN Product Change Notice
PDN Product Discontinuance Notice
PGA Pin Grid Array
PLCC Plastic Leaded Chip Carrier
PoP Package on Package
PPM Parts Per Million
PQFN Power Quad Flat pack No-lead
PQFP Plastic Quad Flat Pack
PWB Printed Wiring Board
QFN Quad Flat No-lead
QFP Quad Flat Pack
QML Qualified Manufacturer List
QPL Qualified Part List
RF Radio Frequency
RFI Radio Frequency Interference
RH Relative Humidity
RMS Root Mean Square
SAC Tin Silver Copper (SnAgCu)
SLC Single-Level Cell
SM Surface Mount
SMD Surface Mount Device
SMT Surface Mount Technology
SOC System-On-Chip
SOIC Small Outline Integrated Circuit
SOP System-On-Package/Small Outline Package
SOWIC Small Outline Wide Integrated Circuit
SRAM Static Random Access Memory
Td Decomposition Temperature
TFBGA Thin Fine-pitch Ball Grid Array
TFT Thin Film Transistor
Tg Glass Transition Temperature
TH Through Hole
TTL Transistor-Transistor Logic
UBGA Micro Ball Grid Array
UV Ultraviolet
VCO Voltage Controlled Oscillator
VLSI Very Large Scale Integration
WLP Wafer Level Package
ZIF Zero Insertion Force